Tracked shipping to South Africa with premium packaging for just R199 

Ship to
South Africa
0

My Account

  • argentina
  • chile
  • colombia
  • españa
  • méxico
  • perú
  • estados unidos
  • internacional

menu

Select your country

Americas

Europe

Rest of the world

portada Extraction of Semiconductor Diode Parameters: A Comparative Review of Methods and Materials
Type
Physical Book
Author
Publisher
Language
English
Pages
174
Format
Hardcover
ISBN13
9783031488467
Categories

Extraction of Semiconductor Diode Parameters: A Comparative Review of Methods and Materials

Richard Ocaya (Author) · Springer · Hardcover

Extraction of Semiconductor Diode Parameters: A Comparative Review of Methods and Materials - Ocaya, Richard

Cheaper New Book Imported to South Africa
Delivery: 07 Oct - 20 Oct Shipping: 17 to 21 business days.
R 2,461
Faster New Book Imported to South Africa
Delivery: 02 Oct - 12 Oct Shipping: 14 to 15 business days.
R 2,986
R 2,461

Choose the list to add your product or create one New List

Go to My Wishlists
Calculate shipping cost

Synopsis "Extraction of Semiconductor Diode Parameters: A Comparative Review of Methods and Materials"

This book presents a comprehensive treatise on the extraction of semiconductor diode parameters using various methods. Its focus is on metal-semiconductor, metal-insulator-semiconductor, and p-n junction diodes, covering a wide range of metals and semiconductors, including elemental, compound, organic, and nanostructured materials. By bringing together these methods in one place, this book provides a much-needed standardized point of reference for the field.The methods used for device characterization have spread widely but not yet critically compared and contrasted. This book aims to bridge this gap by offering a comparative review of the methods and providing the most accurate information on current developments. The result is a valuable resource for researchers and practitioners who seek to optimize their use of semiconductor diodes in their work. With its thorough coverage and critical analysis, this book fills a large void in the field of semiconductor device characterization. It is an essential reference for anyone interested in the extraction of semiconductor diode parameters using a variety of methods.

Customers reviews

More customer reviews
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)

Frequently Asked Questions about the Book

Is the book original?

All books in our catalog are Original.

In what language is the book written?

The book is written in English.

What is the format of this book?

The binding of this edition is Hardcover.

Questions and Answers about the Book

Do you have a question about the book? Login to be able to add your own question.

Opinions about Bookdelivery

More customer reviews